Analog Devices, Inc. has introduced a new portfolio of next-generation 16-to-24-bit, ultra-high precision successive approximation register (SAR) analog-to-digital converters (ADCs) that simplify the often complex process of designing ADCs into instrumentation, industrial and healthcare applications. This new high-performance SAR ADC family features ADI’s patented Easy Drive technology and versatile Flexi-SPI serial peripheral interface (SPI) that solve system design challenges and broaden the selection of directly compatible companion products.
First, in the pin-compatible SAR ADC family of six, the 24-bit dual-channel, simultaneous sampling, two Megasamples (Msps) per second per channel AD4630-24 features an accuracy rating of 0.9 parts per million (ppm), which is a 4x improvement when compared to others. The AD4630-24 integrates a reference buffer and all critical decoupling components into a single chip, providing a 2x improvement in solution density when compared with others.
Key Features of AD4630-24 SAR ADC
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Highest accuracy: Guaranteed accuracy rating of 0.9 ppm INL with a typical performance of 0.1 ppm
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Highest performance: Signal-to-noise ratio rating of 105.7 dB typical
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Small solution size: Chip scale ball grid array (CSP-BGA) package integrates all the critical power supply and reference bypass capacitors to reduce footprint and system component count
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Wide common-mode input range: Ensures compatibility with both single-ended and differential input signal chains.
ADI’s Easy Drive technology maintains device performance while eliminating many traditional system-level design challenges such as strict layout guidelines, rigid digital interface timing requirements, and the complicated selection of companion products. The versatile Flexi-SPI digital interface eases host processor and ADC integration by providing easy-to-meet timing requirements. The combination of high performance with this reimagined digital interface provides a better overall design experience while also accelerating the system design cycle.
