New Smart Gate Driver Photocoupler Helps Simplify Design of Peripheral Circuits for Power Devices

Published  August 31, 2022   0
L Lakshita
Author
Smart Gate Driver Photocoupler

Toshiba Electronic Devices & Storage Corporation has expanded its lineup of smart gate driver photocouplers with the new TLP5222 which is a 2.5A output smart gate driver photocoupler with a built-in automatic recovery function from the protective operation. This new photocoupler features a wide-rated operating temperature range of between -40°C and 110°C and is suitable for various applications in harsh thermal environments such as photovoltaic power generation systems and uninterruptible power supplies (UPSs).  

TLP5222 photocoupler constantly monitors the drain-source voltage (VDS) or collector-emitter voltage (VCE) of the power device that it drives. Built-in overcurrent detection and a protective function detect any rise in VDS or VCE, the result of overcurrent generated in the power device, and gently turn it off. It also incorporates an isolated FAULT status feedback function that transmits a fault signal to the controller when overcurrent is detected, and an active Miller clamp function that prevents upper and lower power devices from being short-circuited, helping to simplify design and reduce external circuits.

Key Features

  • Built-in automatic recovery function from protective operation

  • Peak output current rating: IOPH/IOPL = ±2.5 A

  • Built-in protection functions such as overcurrent detection, isolated fault status feedback, and active Miller clamp

  • A SO16L package that ensures creepage and clearance distances of 8mm (min)

Housed in a SO16L package that ensures creepage and clearance distances of 8mm (min), TLP5222 can also be used in equipment requiring high insulation performance. The lineup also includes TLP5212, TLP5214A, and TLP5214, which do not have a built-in automatic recovery function but reset to their normal operation by a signal input to their LED, allowing users to select the right products for use conditions.